Jun 21 2007
Oxford Instruments已经推出了一种新的，便携式的X射线荧光（XRF）分析仪，并用真空泵快速分类金属回收行业的高价值合金。X-MET3000TXV+现在可以测量铝中的硅和镁，以及钛合金中铝的铝，这些合金以前无法用便携式XRF仪器测量。使用扳机的一个拉力，轻巧的X-MET3000TXV+可提供比有史以来快速准确的合金识别以及样品组成的详细定量分析的结果。
With this system, there is no compressed gas bottle to carry, the cost of consumables is eliminated and sorting won’t stop when the gas runs out. The small and efficient vacuum pump does not have an external valve which might get blocked in dusty environmental operating conditions.
高分辨率Pentapin™检测器增强了新的真空特征，该检测器可提供更快的分析和较低的检测极限。它的配置主要是为了识别仅通过其铝含量分化的硅或镁和钛合金的浓度而分化的铝合金。该单元为需要快速分开的铸造和制造铝合金，识别5000系列合金并区分4000系列合金的用户带来了最大的价值。X-MET3000TXV+可以在所有其他合金类型（镍合金，不锈钢，铜合金等）上执行相同的X-MET3000TX+分析仪的高标准。
借助传统的便携式XRF分析仪，合金识别基于对重元素的分析，因为镁，铝和硅会产生空气阻碍的低能X射线。X-MET3000TXV+的便携式真空泵撤离了空气的分析路径，从而使这些元素的测量成为可能。
Inclusion of the new PentaPINTM detector - which is based on the Oxford Instruments’ proven and patented PentaFET® technology - enables faster analysis and lower detection limits for all elements to be analyzed. Low detection limits are an irreplaceable feature due to the exacting standards of the metal recycling industry. With the PentaPINTM detector, a ten second analysis produces the equivalent of a thirty second analysis made using an instrument with a standard Si-PIN detector. New improved software has been implemented to process the data generated by the detector and increases the accuracy of the results obtained.