Bruker今天宣布发布其下一代台面Contourx 3D光学轮廓计对于研发和制造环境的能力表面纹理和粗糙度计量。
这white light interferometry (WLI) platform features Bruker’s new USI mode, a universal scanning mode that automatically determines the optimal measurement parameters for best metrology results, as well as Advanced PSI mode for lower-noise measurements and best-in-class, subnanometer Z resolution. Additionally, a 5MP camera and new stage design significantly boosts large-area stitching, allowing for the collection of 1000 high-resolution stitched fields. This combination of features and capabilities enables greater convenience and productivity in a host of demanding research and industrial applications, ranging from studying novel material structures and characterizing manufactured components for medical, automotive, and aerospace to highly accurate measurements for precision machining, cosmetics, and semiconductor manufacturing.
“Starting with our original Wyko instruments and continuing over four decades of innovation in high-precision surface metrology and imaging, Bruker’s optical profilers have become known for the best Z-axis resolution, independent of magnification, as well as the fastest measurements with the largest fields of view on the most difficult surface geometries,”肯特·赫斯副总裁兼德鲁克摩泽尔副总经理，手写笔和光学计量业务。“通过继续推动这项技术可以做的内容，Contourx.系统以BEBCHTOP形式提供以前的无法实现的测量功能。“
“Contourx.真正的表面测量性能，特别是鉴于我们的新USI模式。全球产品经理增加了这些系统，为学术研究，工业研发，微电子，光学和传感器进行了新的基准和纳米级表面粗糙度和拓扑测量。“
关于Contourx 3D光学分析器
这Contourx.Profileomers系列利用许多Bruker-Orive WLI技术进步，以提供业界最有能力的Benchtop Metrology，最容易使用表面测量软件。有三个台式型号，Contourx.Profilers采用新颖，强大的设计，并提供各种功能和优化的价格，以满足各个计量和预算要求。新的硬件功能包括一个创新舞台设计，可实现较大的拼接功能和带1200x1000测量阵列的5MP摄像头，用于较低的噪音，更大的视野和更高的横向分辨率。除了新的USI和Advanced PSI模式之外，软件增强功能还包括Bruker的新VisionXpress接口，它可以简单直观地访问屡获殊荣的Vision64®分析软件套件的全功率，并使这些分析器非常适合多用户环境。最新版本的VisionMap软件进一步补充了具有自定义报告功能和高级分析解决方案的特征的功能。
来源：https://www.bruker.com/