CRAIC技术公司是UV可见NIR微分析解决方案的主要创举者,为引入CRAIC电影ProTM薄度软件感到自豪。该软件包设计插件插件CRAIC技术微分数计及其控制 Lambdafiem软件
亚博网站下载CRAIC电影ProTM允许用户快速非破坏性测量薄膜厚度。CRAIC电影ProTM能分析多片透明不透明子串,CRAIC电影ProTM能让用户判定从半导体、MEM设备、磁盘驱动器到平板显示器等所有事物薄薄薄薄薄薄薄膜厚度。这一强软软件可在许多不同领域使用,从研究到工业设置等所有事物中使用。
多客户想测量小型采样区薄膜的厚度,快速质量控制产品。CRAIC电影ProTM模块插件可加到CRAIC技术微分数计中以实现此能力。该软件的构建响应客户对强软胶片工具的请求,该工具可测量透明不透明子片区。CRAIC技术微分数表安装CRAIC电影ProTM满足这些需求
博士Paul Martin总统
亚博网站下载The complete CRAIC Technologies microspot film thickness solution combines an advanced microspectrophotometer with the sophisticated CRAIC FilmPro™ software. This software is a plug-in module to CRAIC Technologies Lambdafire instrument control software. It enables the user to measure film thickness by either transmission or reflectance of many types of materials and substrates. Due to the flexibility of the CRAIC Technologies design, sampling areas can range from over 100 microns across to less than a micron. Designed for both research and the production environment, it incorporates a number of easily modified processing recipes, the ability to create new film recipes and sophisticated tools for analyzing data. With the addition of spectral mapping from CRAIC Technologies, film thickness maps of entire devices can be created.
CRAIC电影ProTM微点薄片测量软件和CRAIC技术微点薄片工具的更多信息访问www.microspectra.com