MRS 2010 Fall Meeting Videos

Jon Shein from Thermo Fisher Scientific runs a demonstration, showing how quickly the Niton XL2 handheld XRF analyzer can be used to determine the composition of stainless steel samples.

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Asylum Researchhas introduced unique technology for characterizing battery materials for their Cypher AFM. Called Electrochemical Strain Microscopy, this technique allows you to look at lithium ion transport capabilities of materials. Sergei Kalinin from Oak Ridge National Laboratory explains how this technique works and Roger Proksch from Asylum Research demonstrates how the Cypher produces data and its relevance to the field of battery materials.

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Brad Dodrill from Lake Shore Cryotronics shows us through one of their cryogenic micromanipulator probe stations. These are used to characterize electronic and magneto transport properties of materials such as semiconductor wafers.

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Ross Smith from Bruker tells us about the all new AcuityXR measurement mode for optical and surface profilers. Introduced at 2010 MRS Fall Meeting, AcuityXR combines hardware and software to provide resolution beyond the diffraction limit. This allows the optical profiler to image features down to 130nm. Acuity XR is available on Bruker's range of Contour GT optical and surface profilers.

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The LVEM5 from Delong America is a unique piece of equipment, being the only benchtop TEM on the market.

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Jon Shein from Thermo Fisher Scientific demonstrates how their Niton XL3t handheld XRF analyzer can quickly check for lead content/contamination in consumer items.

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镭射气手持式光谱仪分析仪产品的范围from Thermo Fisher Scientific is displayed. These products include the Niton XL2 and the flagship Niton XL3t. Features and applications of both instruments are described. Accessories for making measurements easier and faster in the field are also shown.

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Take a quick video tour of the OmegaScope AFM-Raman from AIST-NT. The OmegaScope is based on AIST-NT's Smart-SPM, and features either single or 3 laser Raman capabilities and an objective lens up to 100x magnification.

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The FlexAFM from Nanosurf is a full featured atomic force microscope designed for research applications. It features a modular design, flexure stage which minimizes background movement, decoupled z-piezo and a unique interchangeable nose cone permitting use in air or liquid media, making it suitable for biological samples.

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The Multiview Series from Nanonics Imaging Ltd combines AFM and Raman. The Nanonics can be supplied as an upgrade to an existing Raman system or as a complete system. David Lewis from Nanonics explains how their system works and its advantages and the benefits of being able to determine the chemical structure of the material as well as its topography.

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The new LensAFM from Nanosurf has been designed to integrate with optical microscopes and profilers, and add AFM capabilities to them. This demonstration shows how easy it is to switching between AFM and optical microscopy/profiler modes.

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The NHT2 Nanoindentation tester from CSM Instruments combines a nanoindenter and AFM in one compact, affordable, easy to use desktop unit. This version has been re-designed and now features liquid compatibility, a wider load range and multi sample capability. The use of two video cameras, proving a side view and a top view of the sample eliminate the need for an optical microscope.

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The NanoIR system from Anasys Instruments is a unique instrument that combines AFM and IR Spectroscopy. Kevin Kjoller explains how the system works, how they have been able to integrate an atomic force microscope and infrared spectroscope to generate topographical, localised mechanical, thermal and chemical data for polymeric and organic materials.

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Ben Garland from Zeta Instruments demonstrates their Zeta-20 Optical Profilometer which can measure surface and textural properties of materials such as solar cells, microfluidics, biologicals, etc.

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Dave Shepard from Netzsch Instruments MMC 274 Nexus Multi Module Calorimeter. It is suited to liquids and battery materials. The instrument can employ different modules depending on what type of measurement is required. Modules that can be supplied can perform measurement akin to differential scanning calorimetry (DSC), accelerating rate calorimetry and very fast tracking, to simulate runaway heating.

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Jon Shein from Thermo Fisher Scientific demonstrates how the Niton XL2 handheld XRF analyzer can quickly and easily determine the composition of precious metals like gold jewelry. In the space of less then 2 minutes the Niton XL2 accurately analyze 2 different samples

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Celeste Jenkins from Agilent Technologies explains the importance of source measurement units or SMU's for the characterization of electrical properties of materials and devices. They are typically used on materials like silicon-based solar cells.

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Nicholas Randall features and capabilities new Nanotribometer CSM Instruments. It uses similar loadings to an AFM, but can use wear partners with different size and shapes comapred to an AFM probe tip.

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Chris Orsulak from Bruker points out the main features of the ContourGT Optical Profiler and briefly describes how it works. he also shows us how it can take measurements in very short time frames and how the new AcuityXR measurement mode (introduced at the 2010 MRS Fall Meeting) can produce improved results due to the increased lateral resolution.

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Sean Gasparovic shows us the Keyence VHX-1000 fully integrated digital microscope system. It includes an optical system designed specifically to work with a CCD, with magnification from 0.1X to 5000X

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戴夫·谢泼德从Netzsch仪器向我们展示了用力推ough their STA 449 F1 Jupiter simultaneous TGA/DSC (Thermogravimetric Analyzer/Differential Scanning Calorimeter). This instrument can be used to measure mass change and energy absorbed or given off, or enthalpy. This data can be used to determine such things as melting points, phase transformations, glass transition temperatures, thermal decomposition or oxidation.

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Bill Flecky and Andrey Krayev from AIST-NT show us how easy the SmartSPM is to use. It is able to perform scans very quickly, and in the space of just a few minutes we see them set up the instrument and take a series of measurements.

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Peter LaPuma from Bruker AXS takes us for a tour of the new flag ship D8 Discover X-Ray Diffractometer (XRD). One of the key features to this XRD is the easy exchange optics that can be swapped in just seconds and any change is both auto-detected by the system and is self aligning, requiring no special tools to do so. This allows rapid swapping of configurations.

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The alpha 300R Plus from WITec is a confocal Raman microscope with two scanning systems, a coarse motorized stage for large areas and a piezo stage for fine, sub nanometer adjustments. It is capable of producing 3 dimensional optical and chemical information and features optical components that are all coupled by optical fibres. It is also able to have an AFM added to increase its resolution to the sub-nanometer level.

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Mountains Map 6 is the latest generation roughness and texture analysis software from Digital Surf. It is designed to work with instruments such as optical profilometers, confocal microscopes, scanning probe and atomic force microscopes and can deal with samples as large as automotive panels down to AFM size of just a few microns. The latest features of version 6.0 are outlined and a live demonstration of its capabilities provided.

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John Treadgold from Carl Zeiss NTS shows us the main features and specifications of the Sigma VP (Variable Pressure) scanning electron microscope (SEM).

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