使用Pilatus3技术的X射线检测器

The standards set by the established PILATUS X-ray detectors have been further raised by the PILATUS3 X-ray detector series. PILATUS3 detectors are based on an improved CMOS readout ASIC, with shorter readout time. They are equipped with DECTRIS instant retrigger technology (patent pending) and can be used with future cadmium telluride (CdTe) sensors, which are potential alternatives for silicon sensors and will considerably optimize quantum efficiency at high X-ray energies.

Instant retrigger technology facilitates highly accurate count rate correction and non-paralyzable counting. The improvements such as improved pixel uniformity, counter overflow handling, and reduced crosstalk enable thepilatus3探测器to deliver high-rate counting performance. Increased frame rates can be achieved with the reduced readout time.

Pilatus3 X射线检测器的关键优势

以下是Pilatus X射线检测器的主要优点：

• Dectris Instant Retrigger技术用于不可分析的计数
• 本地和全球计数率最高
• Reduced readout time and increased frame rates
• 与未来的CDTE传感器的兼容性，用于高能应用
• Highly accurate count rate correction for supreme data quality at high count rates

Instant Retrigger技术

作为一种光子计数成像技术，即时重新攻击技术与可调节时间相结合，可实现不可分析的计数，并具有增强的高速计数性能。在常规的单光子计数X射线检测器中，通过数字电路计数通过撞击光子产生的电荷脉冲。当同时产生的脉冲被堆积时，这种类型的检测器面临问题，从而导致光子计数的损失。在高光子通量下，脉冲堆积对观察到的计数速率的影响是值得注意的，导致计数回路完全瘫痪。

高计数率的计数损失是通过在Pilatus单光子计数混合像素X射线检测器中应用计数率校正来否定的。但是，反瘫痪限制了最大可用计数率。Instant Retrigger技术在每次计数之后的预定时间间隔后重新评估脉冲信号。在脉搏堆积的情况下，即时重新攻击技术可以重新攻击计数电路。相应的死时间间隔是可调的，等于一个单光子脉冲的宽度。这导致了不可分析的计数并实现了增强的计数率校正，因此可以以高计数速率实现增强的数据质量。

Figure 1.Signal waveforms illustrating instant retrigger technology. Image credit: Dectris Ltd.

图1列出了即时重新攻击技术的原理。第一个图像显示了撞击光子产生的信号脉冲和单光子计数的有效鉴别阈值水平。脉冲信号由一个单个脉冲，两个脉冲的堆积和多个脉冲堆组成。第二张图像说明了各自的数字判别器输出信号触发计数电路。第三张图像表示由常规的单光子计数X射线检测器注册的相应计数，揭示了在脉搏堆积和随后的瘫痪的情况下，光子计数的损失。

The corresponding dead-time generator output signal generated by a single-photon counting X-ray detector equipped with instant retrigger technology is shown in the fourth image. Here, a preset dead time interval is initiated whenever a count is registered. The final image represents the respective counts being registered, including possible retriggering of the counting circuit following the dead-time interval after each count. This data reveals the more accurate counting of the pulses during pile-up and that counting is non-paralyzable.

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Improved High-Rate Counting Performance

与较早的Pilatus X射线检测器相比，pilatus3 X射线检测器由于CMOS读数ASIC的改进，包括用于不可分析计数的即时retrigger技术，因此提供了提高的高速计数性能。不可分析的计数是增强高速计数性能的基础。此外，实施反溢流处理可以毫无疑问地确定传入的光子速率。为了在整个模块上获得提高的计数率同质性，提供了增强的像素均匀性。这种新设计的其他优势包括更好的稳定性，降低的串扰以及更高的本地和全球计数率。

Figure 2.与以前的Pilatus X射线检测器相比，使用Dectris Instant Retrigger技术的Pilatus3 X射线检测器的典型计数率特性。Image credit: Dectris Ltd.

Figure 2 shows the comparison of the typical count rate characteristics of PILATUS3 X-ray detectors equipped with DECTRIS instant retrigger technology against preceding PILATUS X-ray detectors. PILATUS3 X-ray detectors not only have considerably improved count rate capabilities but also involve more accurate application of count rate correction. This results in better data quality with rates more than 10⁷单像素中每秒的光子。如果全球计数率没有任何限制，新设计可以处理3 x 10以上的全球速率⁸photons per second and mm².

与CDTE传感器的兼容性

通过选择处理倒的极性传感器信号，PILATUS3 X射线检测器可以与未来的CDTE传感器一起使用。CDTE传感器有可能在高能应用中替代硅传感器。

Shorter Readout Time

在较短的读数时间低于1 ms的时间内，Pilatus3 X射线检测器可以达到更高的100-500 Hz帧速率。

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