A highly appreciated feature in scanning electron microscopy (SEM) is the wide field of view. This makes it possible to provide images of large objects with excellent topographical and material contrast and high resolution, and also enables sample navigation. This is because in tandem with dedicated software, high resolution images can be connected to wide field view images in a matter of one single click. With this feature, sample navigation is made easier and analysis is also made relatively faster and efficient.
Macroscopic Analysis with TESCAN S8000 Microscope
新的Tescan S8000显微镜尚未牺牲宏观分析。Tescan S8000具有Brightbeam™SEM柱技术。电子光学元件基于静电磁物镜和已建立的Tescan宽场光学™的组合。宽场光学™具有中间镜头（IML），使Tescan S8000能够创建未变形的大型视野图像（宽场和概述模式），该图像可以与数十毫米的大小一样大。IML还允许对梁进行优化以增加焦点的深度模式。为了成像具有高地形的样品，需要大量的焦点。这些模式使Tescan S8000显微镜成为合适的仪器，用于成像具有出色分辨率，焦点和对比度的大型样品。
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Figure 1.样本：瑞士手表的机制。具有E-T（左上角）和BSE（左下）检测器的深度模式中获取的图像。使用BSE检测器以宽场模式获取的图像。
Tescan USA Inc.
Founded in 1991 by a group of managers and engineers from Tesla with its electron microscopy history starting in the 1950’s, today TESCAN is a globally renowned supplier of Focused Ion Beam workstations, Scanning Electron Microscopes and Optical Microscopes. TESCAN’s innovative solutions and collaborative nature with its customers have won it a leading position in the world of nano- and microtechnology. The company is proud to participate in premier research projects with prominent institutions across a range of scientific fields. TESCAN provides its clients with leading-class products in terms of value, quality and reliability. TESCAN USA Inc. is the North American arm of TESCAN ORSAY HOLDINGS, a multinational company established by the merger of Czech company TESCAN, a leading global supplier of SEMs and Focused Ion Beam workstations, and the French company ORSAY PHYSICS, a world leader in customized Focused Ion Beam and Electron Beam technology.
This information has been sourced, reviewed and adapted from materials provided by TESCAN USA Inc.
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